{"title":"介质材料参数测量对波导介质谐振器特性的影响","authors":"R. I. Belous, Yu. G. Makeev, A. P. Motomenko","doi":"10.1109/CRMICO.2003.158980","DOIUrl":null,"url":null,"abstract":"A method of parameters measurement of dielectric materials based on resonance characteristics of a structure which consists of a cylindrical evanescent waveguide partially filled with dielectric element has been considered. Using the expressions associated with the resonance characteristics of the resonator the permittivity and the loss tangent of a dielectric for the dielectric element made of Teflon have been obtained.","PeriodicalId":131192,"journal":{"name":"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.","volume":"436 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement of parameters of dielectric materials on characteristics of waveguide dielectric resonator\",\"authors\":\"R. I. Belous, Yu. G. Makeev, A. P. Motomenko\",\"doi\":\"10.1109/CRMICO.2003.158980\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of parameters measurement of dielectric materials based on resonance characteristics of a structure which consists of a cylindrical evanescent waveguide partially filled with dielectric element has been considered. Using the expressions associated with the resonance characteristics of the resonator the permittivity and the loss tangent of a dielectric for the dielectric element made of Teflon have been obtained.\",\"PeriodicalId\":131192,\"journal\":{\"name\":\"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.\",\"volume\":\"436 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2003.158980\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2003.158980","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of parameters of dielectric materials on characteristics of waveguide dielectric resonator
A method of parameters measurement of dielectric materials based on resonance characteristics of a structure which consists of a cylindrical evanescent waveguide partially filled with dielectric element has been considered. Using the expressions associated with the resonance characteristics of the resonator the permittivity and the loss tangent of a dielectric for the dielectric element made of Teflon have been obtained.