{"title":"朝着更有效的BIT蓝图内置测试","authors":"G. Daugherty, M. Steinmetz","doi":"10.1109/ARMS.1990.67983","DOIUrl":null,"url":null,"abstract":"Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"BIT blueprint toward more effective built-in test\",\"authors\":\"G. Daugherty, M. Steinmetz\",\"doi\":\"10.1109/ARMS.1990.67983\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<<ETX>>\",\"PeriodicalId\":383597,\"journal\":{\"name\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1990.67983\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67983","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<>
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