S/390微处理器芯片的R(f)L(f)C耦合噪声评价

H.H. Smith, Aline Deutsch, S. Mehrotra, D. Widiger, M. Bowen, A. Dansky, G. Kopcsay, B. Krauter
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引用次数: 11

摘要

提出了一种基于全芯片RLC提取与仿真的高性能S/390微处理器耦合噪声评价方法。根据包括电感耦合效应在内的全芯片噪声评估的工具要求,讨论了关于已知网络拓扑的RC耦合评估的不准确性的片上布线指南。提取和模拟方法是根据算法和程序来描述的,这些算法和程序用于考虑频率相关的RLC效应,从而允许进行完整的芯片噪声评估。给出了比较S/390微处理器布线数据的RC和R(f)L(f)C评估之间的噪声幅度差异以及运行时间和内存使用等相关统计数据的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
R(f)L(f)C coupled noise evaluation of an S/390 microprocessor chip
A coupling noise evaluation of a high performance S/390 microprocessor using a full chip RLC extraction and simulation process is presented. Review of on-chip wiring guidelines with respect to the inaccuracies of an RC coupling evaluation for known net topologies is discussed in terms of tool requirements for full-chip noise evaluation which include inductive coupling effects. The extraction and simulation approach is described in terms of algorithms and procedures used to account for the frequency dependent RLC effects in a manner that allow a full chip noise evaluation. Results are presented which compare noise amplitude differences between RC and R(f)L(f)C evaluations for the wiring data of an S/390 microprocessor as well as pertinent statistics such as run times and memory usage.
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