Electro-magnetic Crosstalk Effects in a Millimeter-wave MMIC Stacked Cell

This work discusses the design of a 2-stacked cell at 36 GHz, analyzing the large discrepancies found between circuit-level and electro-magnetic (EM) simulations due to crosstalk (gate power leakage). At millimeter-wave frequencies, EM optimization of the inter-stage matching is crucial, however, its layout compactness poses several issues on the selection of the EM set-up, thus simulations reliability was put in doubt. To dispel this doubt the cell was fabricated and tested, demonstrating the effectiveness of EM predictions and the actual presence of gate power leakage. This required a deep re-design of the cell, currently on-going, based on a completely different inter-stage matching approach.