{"title":"采用一种新的数值方法对影响索耶-塔铁电薄膜迟滞测量的电路畸变和无源层效应进行校正","authors":"R. Bouregba, G. Poullain","doi":"10.1109/ISAF.2002.1195858","DOIUrl":null,"url":null,"abstract":"A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.","PeriodicalId":415725,"journal":{"name":"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.","volume":"215 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Novel numerical method to correct for both circuit distortions and passive layers effect affecting Sawyer-Tower ferroelectric thin films hysteresis measurements\",\"authors\":\"R. Bouregba, G. Poullain\",\"doi\":\"10.1109/ISAF.2002.1195858\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.\",\"PeriodicalId\":415725,\"journal\":{\"name\":\"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.\",\"volume\":\"215 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2002.1195858\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2002.1195858","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Novel numerical method to correct for both circuit distortions and passive layers effect affecting Sawyer-Tower ferroelectric thin films hysteresis measurements
A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.