从系统到工厂的电路包- McErt芯片

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI:10.1109/TEST.1991.519728

Partha Raghavachari

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引用次数: 7

摘要

我们描述了一种用于at&t StarServerTM产品的VLSI器件。在电路板级的硬件EiIST。它集存储控制、误差调节和存储阵列测试功能于一体。可编程存储器测试算法可由系统用户调用。通过边界骗局提供了到BIST设施的工厂接口。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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CIRCUIT PACK BIST FROM SYSTEM TO FACTORY - THE MCERT CHIP

We describe a VLSI device used in AT&:T StarServerTM products that provid.ea hamdware EiIST at the circuit board level. It integrakes memory control, error regulation and test functions for memory arrays. Programmable memory test algorithms may be invoked by the system user. A factory interface to the BIST facility is provided through boundary scam.

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来源期刊

1991, Proceedings. International Test Conference

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