193nm离子束溅射氧化涂层的性能增强

H. Blaschke, M. Lappschies, D. Ristau
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引用次数: 0

摘要

利用氧化物混合物作为涂层设计的层材料已经转移到离子束溅射技术中,并应用于波长为193nm的高反射和抗反射组件。氧化物SiO2和Al2O3是200nm以下合适薄膜设计的候选材料。从激光量热测量,光谱调查和激光诱导损伤测试收到的实验数据提出了几个样品。关于DUV光谱范围内最先进的薄膜沉积,传统的四分之一波设计也已被表征,并将与溅射混合氧化物涂层进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance enhancement of ion beam sputtered oxide coatings for 193 nm
The utilization of oxide mixtures as layer material for coating design has been transferred to the ion beam sputtering technology and was applied to high-reflecting as well as anti-reflecting components at the wavelength of 193nm. Exclusively, the oxides SiO2 and Al2O3 are candidates for appropriate thin film designs below 200nm. Experimental data received from laser-calorimetric measurements, spectroscopic investigations and laser-induced damage tests are presented for several specimens. With respect to state-of-the-art thin film deposition in the DUV spectral range, conventional quarterwave designs have also been characterized and will be compared to the sputtered mixed oxide coatings.
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