PSoC器件中故障注入的SEU仿真:初步结果

2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA) Pub Date : 2012-12-01 DOI:10.1109/ICTEA.2012.6462894

W. Mansour, R. Velazco, W. El Falou, H. Ziade, R. Ayoubi

{"title":"PSoC器件中故障注入的SEU仿真:初步结果","authors":"W. Mansour, R. Velazco, W. El Falou, H. Ziade, R. Ayoubi","doi":"10.1109/ICTEA.2012.6462894","DOIUrl":null,"url":null,"abstract":"In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.","PeriodicalId":245530,"journal":{"name":"2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"SEU simulation by fault injection in PSoC device: Preliminary results\",\"authors\":\"W. Mansour, R. Velazco, W. El Falou, H. Ziade, R. Ayoubi\",\"doi\":\"10.1109/ICTEA.2012.6462894\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.\",\"PeriodicalId\":245530,\"journal\":{\"name\":\"2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICTEA.2012.6462894\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICTEA.2012.6462894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 6

摘要

本文研究了单事件干扰(SEU)故障对片上系统器件(SOC)的影响。采用赛普拉斯公司生产的PSOC微控制器CY8C27643作为测试载体。在两种不同的硬件/软件环境中，使用所谓的(代码模拟破坏)方法执行故障注入会话。所获得的结果表明，在执行矩阵乘法基准测试时，数字块中出现的一些错误可能造成严重后果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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SEU simulation by fault injection in PSoC device: Preliminary results

In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.

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来源期刊

2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)

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