{"title":"为最新的包装设计底填材料","authors":"O. Suzuki, T. Enomoto, K. Kotaka","doi":"10.1109/issm.2018.8651155","DOIUrl":null,"url":null,"abstract":"In this paper, penetration capability and stress behavior of capillary underfill (CUF) is discussed. The constituent materials of the CUF characterize both the liquid state and the solid state of CUF. Depending on the size of clearance gap, filler size must be optimized. The mechanism of stress transmission by CUF is explained.","PeriodicalId":262428,"journal":{"name":"2018 International Symposium on Semiconductor Manufacturing (ISSM)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of underfill materials for the latest package\",\"authors\":\"O. Suzuki, T. Enomoto, K. Kotaka\",\"doi\":\"10.1109/issm.2018.8651155\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, penetration capability and stress behavior of capillary underfill (CUF) is discussed. The constituent materials of the CUF characterize both the liquid state and the solid state of CUF. Depending on the size of clearance gap, filler size must be optimized. The mechanism of stress transmission by CUF is explained.\",\"PeriodicalId\":262428,\"journal\":{\"name\":\"2018 International Symposium on Semiconductor Manufacturing (ISSM)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Symposium on Semiconductor Manufacturing (ISSM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/issm.2018.8651155\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Symposium on Semiconductor Manufacturing (ISSM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/issm.2018.8651155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of underfill materials for the latest package
In this paper, penetration capability and stress behavior of capillary underfill (CUF) is discussed. The constituent materials of the CUF characterize both the liquid state and the solid state of CUF. Depending on the size of clearance gap, filler size must be optimized. The mechanism of stress transmission by CUF is explained.