{"title":"永久性故障下多数选民的可靠性分析","authors":"Eduardo Liebl, C. Meinhardt, P. Butzen","doi":"10.1109/LATW.2016.7483360","DOIUrl":null,"url":null,"abstract":"CMOS systems have become more susceptible to permanent and transient faults due to the technology scaling. Triple Modular Redundancy is a widely used technique for fault-tolerance. The weak point of this technique is the majority voter. Many researches propose different implementations of voter circuits to tolerate transient faults, but they usually do not evaluate permanent faults. This work investigates the robustness of different majority voters under stuck-on and stuck-open faults. The results show a difference up to 5X in the capacity of tolerate permanent faults.","PeriodicalId":135851,"journal":{"name":"2016 17th Latin-American Test Symposium (LATS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Reliability analysis of majority voters under permanent faults\",\"authors\":\"Eduardo Liebl, C. Meinhardt, P. Butzen\",\"doi\":\"10.1109/LATW.2016.7483360\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CMOS systems have become more susceptible to permanent and transient faults due to the technology scaling. Triple Modular Redundancy is a widely used technique for fault-tolerance. The weak point of this technique is the majority voter. Many researches propose different implementations of voter circuits to tolerate transient faults, but they usually do not evaluate permanent faults. This work investigates the robustness of different majority voters under stuck-on and stuck-open faults. The results show a difference up to 5X in the capacity of tolerate permanent faults.\",\"PeriodicalId\":135851,\"journal\":{\"name\":\"2016 17th Latin-American Test Symposium (LATS)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 17th Latin-American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2016.7483360\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th Latin-American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2016.7483360","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability analysis of majority voters under permanent faults
CMOS systems have become more susceptible to permanent and transient faults due to the technology scaling. Triple Modular Redundancy is a widely used technique for fault-tolerance. The weak point of this technique is the majority voter. Many researches propose different implementations of voter circuits to tolerate transient faults, but they usually do not evaluate permanent faults. This work investigates the robustness of different majority voters under stuck-on and stuck-open faults. The results show a difference up to 5X in the capacity of tolerate permanent faults.