锥形纳米光纤倏逝场穿透深度研究

Radhi M. Chyad, A. Ali, Shrook A. Azzez, A. A. Hamad
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引用次数: 1

摘要

在纳米光纤(NFO)的制造中使用蚀刻技术可以制造更薄、更长、捆扎和坚固的电线。这种蚀刻方法的目的是控制芯直径的减少,并展示两种不同的减少方法应用于制造NFO。大的倏逝场穿透深度是光纤倏逝场传感器(FOEFS)不断增加的原因。一般来说,在光线追迹模型的基础上,剥离包层的光纤的穿透深度(dp)与入射光的波长、周围介质的折射率(RI)和入射角有关。对锥形纳米光纤段和组合锥形探头的光线跟踪分析表明,沿锥度长度的增加,形成了一个分段传感器,其表面可用的激发光增加,用于刺激射线传输。本文采用数值分析的方法,研究了一种基于锥形传感探头的NFO。入射角度、数值孔径(NA)、芯径和锥比(TR)对元件传感器的光功率传输和最终灵敏度都有影响。在某些地区,TR为0.1和0.7的土壤产量更高。在TR=0.1, dp =1140 nm,位置锥度Z=40 mm的锥度长度(L)下,获得最佳效果和最大dp值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study Evanescent-field Penetration Depth in Tapered Nano-fiber Optics
the use of etching in the fabrication of nanofiber optic (NFO) can enable the creation of thinner, longer, bundled, and strong wires. The aim of this etching methodology is to control the reduction of the core diameter and to demonstrate two different reducing methods applied to fabricate NFO. A large penetration depth of an evanescent field (EF) is the explanation of achievement for increasing a fiber-optic evanescent-field sensor (FOEFS). In general, the penetration depth (dp) of an optical fiber, stripped of its cladding, was a relation to the wavelength of the incident light, the refractive index (RI) of the surrounding medium and the incident angle on the basis of the ray-tracing model. Ray tracing analysis of tapered nano fiber optics segments and of combination taper probes make evident that the increases along the length of the taper, creating a segmented sensor with increased excitation light available at the surface for stimulating of ray transmitting. In this work, to study an NFO based on a tapered sensing probe by using the numerical analysis. The light power transmission and ultimate sensitivity of the element sensor are influenced by the incident angle, the numerical aperture (NA), core diameter, and taper ratio (TR). The TR of 0.1 and 0.7 are yield higher dp in certain regions. Then, the optimal result and the maximum dp were obtained with dp =1140 nm in TR=0.1 and a tapering length (L) of position tapering Z=40 mm.
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