一个DOT1和DOT4 mosis兼容库

Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03 Pub Date : 2003-06-01 DOI:10.1109/MSE.2003.1205265

A. Rucinski, B. Stetson, S. T. P. Brundavani

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引用次数: 0

摘要

在微电子课程中，设计主题与测试主题之间缺乏平衡。然而，边界扫描作为一个虚拟探针提供了一个机会，教测试和可测试性设计在这样的课程。IEEE标准的使用、工业的普遍接受以及低成本测试设备的可用性促进了这一努力。本文介绍了一个基于IEEE标准的边界扫描元件库。该库正在使用通过MOSIS服务制造的AMI 0.5微米40引脚微型芯片VLSI器件进行验证。

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A DOT1 & DOT4 MOSIS-compatible library

There exists a lack of balance between design and testing topics in microelectronic curricula. However, boundary scan as a virtual probe presents an opportunity to teach testing and design for testability in such a curriculum. This effort is facilitated by the use of IEEE standards, universal acceptance in industry, and the availability of low cost test equipment. This paper introduces a library of boundary scan components based on the IEEE standards. The library is being verified using the AMI 0.5 micron 40 pin Tiny Chip VLSI device fabricated through MOSIS services.

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来源期刊

Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03

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