{"title":"采用GaAs集成电路和混合电路封装技术的高性能引脚电子器件","authors":"B. Baril, D. Clayson, D. McCracken, S. Taylor","doi":"10.1109/TEST.1991.519743","DOIUrl":null,"url":null,"abstract":"This paper describes the latest generation of pin electronics developed for a high-speed verification ATE system. The pin electronics sub-system provides a driverireceiver with outstanding bandwidth in addition to per-pin current loading and per-pin parametrics. A f.11 custom GaAs IC provides the major features and advanced performance of the driver, receiver, and current load. The combined modules use only 2.5 square inches of circuit board area per tester channel. This paper details the circuit design and measured perfor,mance of the GaAs IC and the three hybrid multichip rzwdules that complete the pin electronics Bnctions.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"HIGH PERFORMANCE PIN ELECTRONICS EMPLOYING GaAs IC AND HYBRID CIRCUIT PACKAGING TECHNOLOGY\",\"authors\":\"B. Baril, D. Clayson, D. McCracken, S. Taylor\",\"doi\":\"10.1109/TEST.1991.519743\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the latest generation of pin electronics developed for a high-speed verification ATE system. The pin electronics sub-system provides a driverireceiver with outstanding bandwidth in addition to per-pin current loading and per-pin parametrics. A f.11 custom GaAs IC provides the major features and advanced performance of the driver, receiver, and current load. The combined modules use only 2.5 square inches of circuit board area per tester channel. This paper details the circuit design and measured perfor,mance of the GaAs IC and the three hybrid multichip rzwdules that complete the pin electronics Bnctions.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519743\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
HIGH PERFORMANCE PIN ELECTRONICS EMPLOYING GaAs IC AND HYBRID CIRCUIT PACKAGING TECHNOLOGY
This paper describes the latest generation of pin electronics developed for a high-speed verification ATE system. The pin electronics sub-system provides a driverireceiver with outstanding bandwidth in addition to per-pin current loading and per-pin parametrics. A f.11 custom GaAs IC provides the major features and advanced performance of the driver, receiver, and current load. The combined modules use only 2.5 square inches of circuit board area per tester channel. This paper details the circuit design and measured perfor,mance of the GaAs IC and the three hybrid multichip rzwdules that complete the pin electronics Bnctions.
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