用于生物传感应用的新型后门控GaN/AlGaN HEMT结构

Shruti Kejriwal, R. Vishnoi, A. Dhawan
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引用次数: 1

摘要

本文提出了一种新型的后门控AlGaN/GaN高电子迁移率晶体管(HEMT)结构,用于检测核酸(dna, rna)等生物分子。该装置由生长在蓝宝石或硅等衬底上的GaN薄膜层之上的AlGaN薄膜层组成,其中衬底完全向后蚀刻,暴露GaN表面以附着核酸分子。利用TCAD Silvaco ATLAS对该装置进行了数值研究,研究了核酸分子在GaN表面的附着效应。当单链和双链DNA和RNA分子带负电荷时,它们在GaN表面的附着会导致AlGaN/GaN界面上2℃气体的变化,从而导致漏极电流的变化。该结构的性能与等效的硅MOS晶体管以及传统的前门控HEMT结构进行了比较。所提出的装置在两种情况下对核酸分子的存在表现出更好的敏感性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel back gated GaN/AlGaN HEMT structure for biological sensing applications
In this paper, a novel back gated AlGaN/GaN High Electron Mobility Transistor (HEMT) structure is proposed for detection of biological molecules such as nucleic acids (DNAs, RNAs). The proposed device consists of a thin film layer of AlGaN on top of a GaN thin film layer grown on a substrate such as sapphire or silicon, wherein the substrate is completely back etched exposing the GaN surface for attachment of nucleic acid molecules. Numerical study of this proposed device was carried out using TCAD Silvaco ATLAS to study the effect of attachment of nucleic acid molecules on the GaN surface. As the single-stranded and double-stranded DNA and RNA molecules are negatively charged, their attachment on the GaN surface leads to a variation of 2DEG gas on the AlGaN/GaN interface and therefore on the drain current. The performance of this structure is compared with an equivalent silicon MOS transistor and also with a conventional front gated HEMT structure. The proposed device shows a better sensitivity to presence of nucleic acid molecules in both the cases.
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