参见下一代LEON 3FT微处理器的结果

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004586

C. Hafer, S. Guertin, B. Baranski, G. Butler, J. Nagy, S. Griffith, A. Jordan

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引用次数: 0

摘要

专用的SEU测试软件用于监测由LEON 3FT处理器内部SRAM中的容错电路纠正的SEU。本文综述了SEL免疫、SEU和TID结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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SEE Results of a Next Generation LEON 3FT Microprocessor

Special SEU test software is used to monitor the SEUs corrected by fault tolerant circuitry in the internal SRAM of the LEON 3FT processor. SEL immunity, SEU, and TID results are reviewed.

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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