用于k波段卫星载荷的GaN MMIC高功率放大器

P. Colantonio, R. Giofré, F. Giannini, Mariano López, L. Cabrìa
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摘要

该贡献介绍了为实现基于氮化镓(GaN)技术的高功率固态功率放大器而开展的活动,目标是在17.320.2 GHz频率范围内实现超过125W的输出功率,为下一代k波段甚高通量卫星(vHTS)设想。为此,特定的单片微波集成电路(mmic)功率放大器(PAs)在市售的100 nm栅长GaN on Silicon (GaN- si)工艺(OMMIC工艺D01GH)上开发。该设计考虑了空间可靠性对电气参数的约束,并考虑了航天器的温度限制,这对该技术来说是极具挑战性的,在最坏情况下(即最高环境温度为85^{\circ}\mathrm{C})$,保持所有器件的结温低于160^{\circ}\mathrm{C}$)$。最后的MMIC基于三级架构,在圆片和脉冲条件下演示了在全ka波段卫星下行链路(即17.3 GHz至20.2 GHz)中实现最小输出功率和功率附加效率(PAE)为10W (40dBm)和35%(峰值为45%)。封装版本在连续波(CW)条件下的输出功率大于39.5dBm, PAE优于30%。此外,在饱和输出功率下的长期(24小时)连续波测试显示,性能下降几乎可以忽略不计,从而为所选GaN-Si技术的鲁棒性提供了信心。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
GaN MMIC High Power Amplifiers for K-Band Satellite Payload
This contribution presents the activities carried out towards the realization of a high-power solid state power amplifier, based on Gallium Nitride (GaN) technology, targeting more than 125W of output power in the frequency range 17.320.2 GHz, conceived for the next generation K-band Very High Throughput Satellites (vHTS). For this purpose, specific Monolithic Microwave Integrated Circuits (MMICs) Power Amplifiers (PAs) were developed on a commercially available 100 nm gate length GaN on Silicon (GaN-Si) process (OMMIC process D01GH). The design was carried out considering space reliability constraints on electrical parameters and accounting for the spacecraft temperature limits, which are extremely challenging for this technology, to keep the junction temperature of all devices below $160^{\circ}\mathrm{C}$ in the worst-case condition (i.e., maximum environmental temperature of $85^{\circ}\mathrm{C})$. The final MMIC, based on a three-stage architecture, demonstrates on wafer and in pulsed condition to achieve a minimum output power and power added efficiency (PAE) of 10W (40dBm) and 35% (with a peak of 45%) in the full Ka-band satellite downlink, i.e., from 17.3 GHz to 20.2 GHz. The packaged version demonstrates in continuous wave (CW) conditions an output power larger than 39.5dBm with a PAE better than 30%. Moreover, long-term (24h) CW test at saturated output power has shown almost negligible performance degradation, thus providing confidence in the robustness of the selected GaN-Si technology.
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