C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast
{"title":"动态偏置的全耗尽SOI射频开关","authors":"C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast","doi":"10.1109/RFIC.2007.380859","DOIUrl":null,"url":null,"abstract":"RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.","PeriodicalId":356468,"journal":{"name":"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Fully Depleted SOI RF Switch with Dynamic Biasing\",\"authors\":\"C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast\",\"doi\":\"10.1109/RFIC.2007.380859\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.\",\"PeriodicalId\":356468,\"journal\":{\"name\":\"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIC.2007.380859\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2007.380859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.