动态偏置的全耗尽SOI射频开关

C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast
{"title":"动态偏置的全耗尽SOI射频开关","authors":"C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast","doi":"10.1109/RFIC.2007.380859","DOIUrl":null,"url":null,"abstract":"RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.","PeriodicalId":356468,"journal":{"name":"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Fully Depleted SOI RF Switch with Dynamic Biasing\",\"authors\":\"C. Chen, C.K. Chen, P. Wyatt, J. Knecht, D. Yost, P. Gouker, P. Healey, C. Keast\",\"doi\":\"10.1109/RFIC.2007.380859\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.\",\"PeriodicalId\":356468,\"journal\":{\"name\":\"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIC.2007.380859\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2007.380859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

基于全耗尽(FD) SOI技术的射频开关首次被报道。在一种新型偏置电路中,将串联MOSFET开关栅极的传统偏置电阻替换为另一个FET,该FET作为可变电阻,在导通和关断状态下具有不同的最佳电阻。FDSOI的低寄生电容提高了开关性能,动态偏置进一步提高了饱和功率。在5ghz频段,带有集成控制电路的单极双掷(SPDT)开关的插入损耗为0.75 db,隔离度为39 db。这种动态偏置SPDT开关的1db压缩功率在5ghz时接近2w。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fully Depleted SOI RF Switch with Dynamic Biasing
RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信