R. Ishii, D. Cho, T. Mori, T. Mizutani, M. Ishioka
{"title":"不同制造工艺制备的低密度聚乙烯的电性能","authors":"R. Ishii, D. Cho, T. Mori, T. Mizutani, M. Ishioka","doi":"10.1109/CEIDP.1999.807887","DOIUrl":null,"url":null,"abstract":"In order to investigate the influence of the manufacturing process on the electrical properties, we used two kinds of low density polyethylene prepared using a metallocene catalyst (mt), linear-low density polyethylene prepared using a Ziegler catalyst (LL) and low density polyethylene by a high-pressure process (LD). mL has the narrowest composition and molecular-weight distributions. We measured the DC and impulse breakdown strengths and current densities at 30/spl deg/C, 60/spl deg/C and 90/spl deg/C. mL had a higher breakdown strength and a lower high-field current than LD and LL. These results were discussed from the point of manufacturing processes.","PeriodicalId":267509,"journal":{"name":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Electrical properties of low-density polyethylene prepared by different manufacturing process\",\"authors\":\"R. Ishii, D. Cho, T. Mori, T. Mizutani, M. Ishioka\",\"doi\":\"10.1109/CEIDP.1999.807887\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to investigate the influence of the manufacturing process on the electrical properties, we used two kinds of low density polyethylene prepared using a metallocene catalyst (mt), linear-low density polyethylene prepared using a Ziegler catalyst (LL) and low density polyethylene by a high-pressure process (LD). mL has the narrowest composition and molecular-weight distributions. We measured the DC and impulse breakdown strengths and current densities at 30/spl deg/C, 60/spl deg/C and 90/spl deg/C. mL had a higher breakdown strength and a lower high-field current than LD and LL. These results were discussed from the point of manufacturing processes.\",\"PeriodicalId\":267509,\"journal\":{\"name\":\"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1999.807887\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1999.807887","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical properties of low-density polyethylene prepared by different manufacturing process
In order to investigate the influence of the manufacturing process on the electrical properties, we used two kinds of low density polyethylene prepared using a metallocene catalyst (mt), linear-low density polyethylene prepared using a Ziegler catalyst (LL) and low density polyethylene by a high-pressure process (LD). mL has the narrowest composition and molecular-weight distributions. We measured the DC and impulse breakdown strengths and current densities at 30/spl deg/C, 60/spl deg/C and 90/spl deg/C. mL had a higher breakdown strength and a lower high-field current than LD and LL. These results were discussed from the point of manufacturing processes.