{"title":"基于共享结构合成bdd的顺序电路建模","authors":"R. Ubar, M. Marenkov, Dmitri Mironov, V. Viies","doi":"10.1109/IDT.2014.7038600","DOIUrl":null,"url":null,"abstract":"A novel type of BDDs called Shared Structurally Synthesized BDDs (S3BDD) is presented for modeling sequential circuits for fault simulation purposes. The size of S BDD is in linear correlation with the circuit size and is characterized by the property of one-to-one mapping between the nodes in the graph and signal paths in the corresponding sequential circuit. A method is proposed for synthesis of S BDDs from the given sequential circuit, which produces as side-effect the collapsed set of fault sites both for stuck-at and delay faults. Thanks to the model compression, the increased speed of simulation and fault reasoning is expected. Experimental results demonstrate the advantages of the new model in terms of size, reduced fault set and estimated fault simulation speed.","PeriodicalId":122246,"journal":{"name":"2014 9th International Design and Test Symposium (IDT)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling sequential circuits with shared structurally synthesized BDDs\",\"authors\":\"R. Ubar, M. Marenkov, Dmitri Mironov, V. Viies\",\"doi\":\"10.1109/IDT.2014.7038600\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel type of BDDs called Shared Structurally Synthesized BDDs (S3BDD) is presented for modeling sequential circuits for fault simulation purposes. The size of S BDD is in linear correlation with the circuit size and is characterized by the property of one-to-one mapping between the nodes in the graph and signal paths in the corresponding sequential circuit. A method is proposed for synthesis of S BDDs from the given sequential circuit, which produces as side-effect the collapsed set of fault sites both for stuck-at and delay faults. Thanks to the model compression, the increased speed of simulation and fault reasoning is expected. Experimental results demonstrate the advantages of the new model in terms of size, reduced fault set and estimated fault simulation speed.\",\"PeriodicalId\":122246,\"journal\":{\"name\":\"2014 9th International Design and Test Symposium (IDT)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 9th International Design and Test Symposium (IDT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDT.2014.7038600\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 9th International Design and Test Symposium (IDT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDT.2014.7038600","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling sequential circuits with shared structurally synthesized BDDs
A novel type of BDDs called Shared Structurally Synthesized BDDs (S3BDD) is presented for modeling sequential circuits for fault simulation purposes. The size of S BDD is in linear correlation with the circuit size and is characterized by the property of one-to-one mapping between the nodes in the graph and signal paths in the corresponding sequential circuit. A method is proposed for synthesis of S BDDs from the given sequential circuit, which produces as side-effect the collapsed set of fault sites both for stuck-at and delay faults. Thanks to the model compression, the increased speed of simulation and fault reasoning is expected. Experimental results demonstrate the advantages of the new model in terms of size, reduced fault set and estimated fault simulation speed.