{"title":"交叉线对两根并联全局线延迟时间的影响[IC互连]","authors":"Sangwoo Kim, C. S. Chang, D. Neikirk","doi":"10.1109/EPEP.1999.819192","DOIUrl":null,"url":null,"abstract":"The length of the address or data lines between the ALU and cache sections on a microprocessor chip may exceed 10 mm. To minimize the delay time impact due to the signal line series resistance, one may use the 2/spl times/2 /spl mu/m/sup 2/ lines on the M7 and/or M8 layers for the address and data buses. We investigate the delay time impact due to the series resistance for two coupled lines on M7, including the influence of the cross-over lines on the M6 and M8 layers. The cross-over lines on M6 and M8 cause increase in self-capacitance and reduction in mutual-capacitance for two adjacent address lines on M7. The delay time of the address or data information, in +/+ and +/- configurations, is affected differently for different line length.","PeriodicalId":299335,"journal":{"name":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of cross-over lines on delay time of two parallel global wires [IC interconnects]\",\"authors\":\"Sangwoo Kim, C. S. Chang, D. Neikirk\",\"doi\":\"10.1109/EPEP.1999.819192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The length of the address or data lines between the ALU and cache sections on a microprocessor chip may exceed 10 mm. To minimize the delay time impact due to the signal line series resistance, one may use the 2/spl times/2 /spl mu/m/sup 2/ lines on the M7 and/or M8 layers for the address and data buses. We investigate the delay time impact due to the series resistance for two coupled lines on M7, including the influence of the cross-over lines on the M6 and M8 layers. The cross-over lines on M6 and M8 cause increase in self-capacitance and reduction in mutual-capacitance for two adjacent address lines on M7. The delay time of the address or data information, in +/+ and +/- configurations, is affected differently for different line length.\",\"PeriodicalId\":299335,\"journal\":{\"name\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1999.819192\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1999.819192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of cross-over lines on delay time of two parallel global wires [IC interconnects]
The length of the address or data lines between the ALU and cache sections on a microprocessor chip may exceed 10 mm. To minimize the delay time impact due to the signal line series resistance, one may use the 2/spl times/2 /spl mu/m/sup 2/ lines on the M7 and/or M8 layers for the address and data buses. We investigate the delay time impact due to the series resistance for two coupled lines on M7, including the influence of the cross-over lines on the M6 and M8 layers. The cross-over lines on M6 and M8 cause increase in self-capacitance and reduction in mutual-capacitance for two adjacent address lines on M7. The delay time of the address or data information, in +/+ and +/- configurations, is affected differently for different line length.