A. Goryu, A. Ikedo, K. Takei, K. Sawada, T. Kawano, M. Ishida
{"title":"面外、集成电路兼容、纳米级尖端硅神经探针阵列的批量制造","authors":"A. Goryu, A. Ikedo, K. Takei, K. Sawada, T. Kawano, M. Ishida","doi":"10.1109/MEMSYS.2009.4805359","DOIUrl":null,"url":null,"abstract":"We developed a batch-fabrication of nanoscale-tip silicon microprobe arrays for use in multipoint nanoscale investigations of cell/neuron in-vivo/in-vitro. Sharpened tips, less than 100nm diameter, can be formed at the tips of out-of-plane three-dimensional silicon microprobe (length ≫10¿m) arrays, by silicon wet etching-based batch-process within only 1-3min, providing precisely controlled tip angles ranging from 15° to 50°. The penetration capability of the nanoscale-tip microprobes was demonstrated, using finite element modeling (FEM) simulations and penetration tests with a gelatin as tissue/cell.","PeriodicalId":187850,"journal":{"name":"2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Batch Fabrication of Out-of-Plane, IC-Compatible, Nanoscale-Tip Silicon Neuroprobe Arrays\",\"authors\":\"A. Goryu, A. Ikedo, K. Takei, K. Sawada, T. Kawano, M. Ishida\",\"doi\":\"10.1109/MEMSYS.2009.4805359\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We developed a batch-fabrication of nanoscale-tip silicon microprobe arrays for use in multipoint nanoscale investigations of cell/neuron in-vivo/in-vitro. Sharpened tips, less than 100nm diameter, can be formed at the tips of out-of-plane three-dimensional silicon microprobe (length ≫10¿m) arrays, by silicon wet etching-based batch-process within only 1-3min, providing precisely controlled tip angles ranging from 15° to 50°. The penetration capability of the nanoscale-tip microprobes was demonstrated, using finite element modeling (FEM) simulations and penetration tests with a gelatin as tissue/cell.\",\"PeriodicalId\":187850,\"journal\":{\"name\":\"2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSYS.2009.4805359\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2009.4805359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Batch Fabrication of Out-of-Plane, IC-Compatible, Nanoscale-Tip Silicon Neuroprobe Arrays
We developed a batch-fabrication of nanoscale-tip silicon microprobe arrays for use in multipoint nanoscale investigations of cell/neuron in-vivo/in-vitro. Sharpened tips, less than 100nm diameter, can be formed at the tips of out-of-plane three-dimensional silicon microprobe (length ≫10¿m) arrays, by silicon wet etching-based batch-process within only 1-3min, providing precisely controlled tip angles ranging from 15° to 50°. The penetration capability of the nanoscale-tip microprobes was demonstrated, using finite element modeling (FEM) simulations and penetration tests with a gelatin as tissue/cell.