{"title":"用于VLSI仿真的MOSFET建模-理论与实践","authors":"N. Arora","doi":"10.1142/6157","DOIUrl":null,"url":null,"abstract":"Overview Review of Basic Semiconductor and pn Junction Theory MOS Transistor Structure and Operation MOS Capacitor Threshold Voltage MOSFET DC Model Dynamic Model Modeling Hot-Carrier Effects Data Acquisition and Model Parameter Measurements Model Parameter Extraction Using Optimization Method SPICE Diode and MOSFET Models and Their Parameters Statistical Modeling and Worst-Case Design Parameters.","PeriodicalId":256342,"journal":{"name":"International Series on Advances in Solid State Electronics and Technology","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"191","resultStr":"{\"title\":\"MOSFET Modeling for VLSI Simulation - Theory and Practice\",\"authors\":\"N. Arora\",\"doi\":\"10.1142/6157\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Overview Review of Basic Semiconductor and pn Junction Theory MOS Transistor Structure and Operation MOS Capacitor Threshold Voltage MOSFET DC Model Dynamic Model Modeling Hot-Carrier Effects Data Acquisition and Model Parameter Measurements Model Parameter Extraction Using Optimization Method SPICE Diode and MOSFET Models and Their Parameters Statistical Modeling and Worst-Case Design Parameters.\",\"PeriodicalId\":256342,\"journal\":{\"name\":\"International Series on Advances in Solid State Electronics and Technology\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"191\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Series on Advances in Solid State Electronics and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1142/6157\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Series on Advances in Solid State Electronics and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/6157","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MOSFET Modeling for VLSI Simulation - Theory and Practice
Overview Review of Basic Semiconductor and pn Junction Theory MOS Transistor Structure and Operation MOS Capacitor Threshold Voltage MOSFET DC Model Dynamic Model Modeling Hot-Carrier Effects Data Acquisition and Model Parameter Measurements Model Parameter Extraction Using Optimization Method SPICE Diode and MOSFET Models and Their Parameters Statistical Modeling and Worst-Case Design Parameters.