脉冲电流注入探头的Spice建模

X. Liu, L. Crosta, F. Grassi, G. Spadacini, S. Pignari, F. Trotti, N. Mora, W. Hirschi
{"title":"脉冲电流注入探头的Spice建模","authors":"X. Liu, L. Crosta, F. Grassi, G. Spadacini, S. Pignari, F. Trotti, N. Mora, W. Hirschi","doi":"10.23919/AeroEMC.2019.8788951","DOIUrl":null,"url":null,"abstract":"In this paper, a SPICE model of a typical nanocrystalline core used for the manufacturing of pulse current injection probes is presented. The model aims at accounting for the frequency response of the material initial complex permeability spectra (small-signal model) as well as for possible saturation occurring within the magnetic core due to the injection of high-amplitude stress waveforms. Strengths and limitations of the proposed prediction model are assessed versus time-domain measurement of the voltage induced at the terminations of the wiring structure under test, when a damped-sinusoidal waveform is injected at the core input port.","PeriodicalId":436679,"journal":{"name":"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Spice Modeling of Probes for Pulse Current Injection\",\"authors\":\"X. Liu, L. Crosta, F. Grassi, G. Spadacini, S. Pignari, F. Trotti, N. Mora, W. Hirschi\",\"doi\":\"10.23919/AeroEMC.2019.8788951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a SPICE model of a typical nanocrystalline core used for the manufacturing of pulse current injection probes is presented. The model aims at accounting for the frequency response of the material initial complex permeability spectra (small-signal model) as well as for possible saturation occurring within the magnetic core due to the injection of high-amplitude stress waveforms. Strengths and limitations of the proposed prediction model are assessed versus time-domain measurement of the voltage induced at the terminations of the wiring structure under test, when a damped-sinusoidal waveform is injected at the core input port.\",\"PeriodicalId\":436679,\"journal\":{\"name\":\"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/AeroEMC.2019.8788951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AeroEMC.2019.8788951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

本文介绍了用于脉冲电流注入探针制造的典型纳米晶芯的SPICE模型。该模型旨在考虑材料初始复磁导率谱的频率响应(小信号模型)以及由于注入高振幅应力波形而在磁芯内可能发生的饱和。当在核心输入端口注入阻尼正弦波形时,通过对被测布线结构末端感应电压的时域测量,评估了所提出的预测模型的优点和局限性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Spice Modeling of Probes for Pulse Current Injection
In this paper, a SPICE model of a typical nanocrystalline core used for the manufacturing of pulse current injection probes is presented. The model aims at accounting for the frequency response of the material initial complex permeability spectra (small-signal model) as well as for possible saturation occurring within the magnetic core due to the injection of high-amplitude stress waveforms. Strengths and limitations of the proposed prediction model are assessed versus time-domain measurement of the voltage induced at the terminations of the wiring structure under test, when a damped-sinusoidal waveform is injected at the core input port.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信