{"title":"内置摄像头模块电磁干扰分析用TEM单元和高灵敏度探头的设计","authors":"Han-Nien Lin, Chung-Wei Kuo, Jhih-Min Liao, Jian-li Dong","doi":"10.1109/EDAPS.2010.5683030","DOIUrl":null,"url":null,"abstract":"Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967–2 [1] and IEC 61967–3 [2] respectively. The goal is to setup a more accurate measurement of the noise source location and the corresponding frequency bands to analyze the platform noise effect. The operating frequency of TEM Cell has been raised up to 2.43 GHz. Two identical IC for Webcam module with some minor modifications were used for EMI measurement and further analysis for the interference effects.","PeriodicalId":185326,"journal":{"name":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Design of TEM cell and high sensitive probe for EMI analysis of built-in Webcam module\",\"authors\":\"Han-Nien Lin, Chung-Wei Kuo, Jhih-Min Liao, Jian-li Dong\",\"doi\":\"10.1109/EDAPS.2010.5683030\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967–2 [1] and IEC 61967–3 [2] respectively. The goal is to setup a more accurate measurement of the noise source location and the corresponding frequency bands to analyze the platform noise effect. The operating frequency of TEM Cell has been raised up to 2.43 GHz. Two identical IC for Webcam module with some minor modifications were used for EMI measurement and further analysis for the interference effects.\",\"PeriodicalId\":185326,\"journal\":{\"name\":\"2010 IEEE Electrical Design of Advanced Package & Systems Symposium\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Electrical Design of Advanced Package & Systems Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2010.5683030\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2010.5683030","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of TEM cell and high sensitive probe for EMI analysis of built-in Webcam module
Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967–2 [1] and IEC 61967–3 [2] respectively. The goal is to setup a more accurate measurement of the noise source location and the corresponding frequency bands to analyze the platform noise effect. The operating frequency of TEM Cell has been raised up to 2.43 GHz. Two identical IC for Webcam module with some minor modifications were used for EMI measurement and further analysis for the interference effects.
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