{"title":"基于CMOS的超低功耗7T SRAM单元设计","authors":"Majid Moghaddam, M. H. Moaiyeri, M. Eshghi","doi":"10.1109/IRANIANCEE.2015.7146428","DOIUrl":null,"url":null,"abstract":"In his paper a 7T SRAM cell operating well in low voltages is presented. Suitable read operation structure is provided by controlling the drain induced barrier lowering (DIBL) effect and body-source voltage in the hold `1' state. The read-operation structure of the proposed cell utilizes the single transistor which leads to a larger write margin. The simulation results at 90nm TSMC CMOS demonstrate the outperforms of the proposed SRAM cell in terms of power dissipation, write margin, sensitivity to process variations as compared with the other most efficient low-voltage SRAM cells.","PeriodicalId":187121,"journal":{"name":"2015 23rd Iranian Conference on Electrical Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Ultra low-power 7T SRAM cell design based on CMOS\",\"authors\":\"Majid Moghaddam, M. H. Moaiyeri, M. Eshghi\",\"doi\":\"10.1109/IRANIANCEE.2015.7146428\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In his paper a 7T SRAM cell operating well in low voltages is presented. Suitable read operation structure is provided by controlling the drain induced barrier lowering (DIBL) effect and body-source voltage in the hold `1' state. The read-operation structure of the proposed cell utilizes the single transistor which leads to a larger write margin. The simulation results at 90nm TSMC CMOS demonstrate the outperforms of the proposed SRAM cell in terms of power dissipation, write margin, sensitivity to process variations as compared with the other most efficient low-voltage SRAM cells.\",\"PeriodicalId\":187121,\"journal\":{\"name\":\"2015 23rd Iranian Conference on Electrical Engineering\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 23rd Iranian Conference on Electrical Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRANIANCEE.2015.7146428\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 23rd Iranian Conference on Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRANIANCEE.2015.7146428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In his paper a 7T SRAM cell operating well in low voltages is presented. Suitable read operation structure is provided by controlling the drain induced barrier lowering (DIBL) effect and body-source voltage in the hold `1' state. The read-operation structure of the proposed cell utilizes the single transistor which leads to a larger write margin. The simulation results at 90nm TSMC CMOS demonstrate the outperforms of the proposed SRAM cell in terms of power dissipation, write margin, sensitivity to process variations as compared with the other most efficient low-voltage SRAM cells.