在CMOS-MEMS谐振电路中实现的一种环衰技术,用于大范围压力传感应用

Wan-cheng Chiu, Chin-Yu Chou, Ming-Huang Li, Sheng-Shian Li
{"title":"在CMOS-MEMS谐振电路中实现的一种环衰技术,用于大范围压力传感应用","authors":"Wan-cheng Chiu, Chin-Yu Chou, Ming-Huang Li, Sheng-Shian Li","doi":"10.1109/FCS.2016.7563594","DOIUrl":null,"url":null,"abstract":"In this work, a 1.2-MHz CMOS-MEMS DETF (double-ended tuning fork) resonator with its on-chip tunable transimpedance amplifier (TIA) is designed to measure the ring-down response of the resonator circuit for pressure sensing applications. From the time-domain ring-down waveform, the frequency and quality factor of the resonator circuit can be extracted corresponding to its environmental pressure. Due to the effect of the squeezed-film damping caused by environmental pressure, the quality factor would change accordingly, thus affecting the waveform of the ring-down characteristic. By measuring the ring-down response under various pressure levels, the designed resonator circuit features a wide pressure sensing range from 0.8 Torr to 220 Torr.","PeriodicalId":122928,"journal":{"name":"2016 IEEE International Frequency Control Symposium (IFCS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A ring-down technique implemented in CMOS-MEMS resonator circuits for wide-range pressure sensing applications\",\"authors\":\"Wan-cheng Chiu, Chin-Yu Chou, Ming-Huang Li, Sheng-Shian Li\",\"doi\":\"10.1109/FCS.2016.7563594\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a 1.2-MHz CMOS-MEMS DETF (double-ended tuning fork) resonator with its on-chip tunable transimpedance amplifier (TIA) is designed to measure the ring-down response of the resonator circuit for pressure sensing applications. From the time-domain ring-down waveform, the frequency and quality factor of the resonator circuit can be extracted corresponding to its environmental pressure. Due to the effect of the squeezed-film damping caused by environmental pressure, the quality factor would change accordingly, thus affecting the waveform of the ring-down characteristic. By measuring the ring-down response under various pressure levels, the designed resonator circuit features a wide pressure sensing range from 0.8 Torr to 220 Torr.\",\"PeriodicalId\":122928,\"journal\":{\"name\":\"2016 IEEE International Frequency Control Symposium (IFCS)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Frequency Control Symposium (IFCS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FCS.2016.7563594\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Frequency Control Symposium (IFCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FCS.2016.7563594","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

在这项工作中,设计了一个1.2 mhz的CMOS-MEMS双端音叉(DETF)谐振器,其片上可调谐跨阻放大器(TIA)用于测量压力传感应用中的谐振器电路的衰响响应。从时域衰荡波形中,可以提取出谐振器电路的频率和与其环境压力相对应的质量因子。由于环境压力造成的挤压膜阻尼的影响,质量因子会发生相应的变化,从而影响衰荡特性的波形。通过测量不同压力水平下的衰荡响应,所设计的谐振器电路具有0.8 ~ 220 Torr的宽压力传感范围。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A ring-down technique implemented in CMOS-MEMS resonator circuits for wide-range pressure sensing applications
In this work, a 1.2-MHz CMOS-MEMS DETF (double-ended tuning fork) resonator with its on-chip tunable transimpedance amplifier (TIA) is designed to measure the ring-down response of the resonator circuit for pressure sensing applications. From the time-domain ring-down waveform, the frequency and quality factor of the resonator circuit can be extracted corresponding to its environmental pressure. Due to the effect of the squeezed-film damping caused by environmental pressure, the quality factor would change accordingly, thus affecting the waveform of the ring-down characteristic. By measuring the ring-down response under various pressure levels, the designed resonator circuit features a wide pressure sensing range from 0.8 Torr to 220 Torr.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信