{"title":"一种利用透射电镜波导标定电场探头的新方法","authors":"S. Ishigami, M. Hirata","doi":"10.1109/EMCZUR.2009.4783481","DOIUrl":null,"url":null,"abstract":"Standard gain horn antennas are used as transmitting antennas for the calibration of an electric-field probe above 1 GHz. However, it is difficult to use horn antennas at frequencies below 1 GHz because of their very large dimensions, which make them difficult to handle. Hence, a calibration method for frequencies below 1 GHz is also required. A probe calibration method using a one-port TEM waveguides is proposed in this paper.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A New Calibration Method for an Electric-field Probe using TEM Waveguides\",\"authors\":\"S. Ishigami, M. Hirata\",\"doi\":\"10.1109/EMCZUR.2009.4783481\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Standard gain horn antennas are used as transmitting antennas for the calibration of an electric-field probe above 1 GHz. However, it is difficult to use horn antennas at frequencies below 1 GHz because of their very large dimensions, which make them difficult to handle. Hence, a calibration method for frequencies below 1 GHz is also required. A probe calibration method using a one-port TEM waveguides is proposed in this paper.\",\"PeriodicalId\":192851,\"journal\":{\"name\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2009.4783481\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2009.4783481","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Calibration Method for an Electric-field Probe using TEM Waveguides
Standard gain horn antennas are used as transmitting antennas for the calibration of an electric-field probe above 1 GHz. However, it is difficult to use horn antennas at frequencies below 1 GHz because of their very large dimensions, which make them difficult to handle. Hence, a calibration method for frequencies below 1 GHz is also required. A probe calibration method using a one-port TEM waveguides is proposed in this paper.
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