{"title":"使用C-R DAC和电容校准的12位20M-S/s SAR ADC","authors":"Eunji Youn, Young-Chan Jang","doi":"10.1109/ISOCC.2018.8649894","DOIUrl":null,"url":null,"abstract":"A successive approximation register (SAR) analog-to-digital converter (ADC) using a capacitor-resistor(C-R) digital-to-analog-converter (DAC) is proposed to implement the resolution of 12 bits maintaining the area for 10 bits. A calibration for upper-bit capacitors of the C-R DAC is proposed to increase the performance of the static and dynamic performances. To evaluate the proposed ADC, a 12-bit 20M-S/s SAR ADC is implemented using a 110-nm CMOS process with a supply of 1.2 V. The area and power consumption of the proposed ADC are 0.204 mm2 and 1.24 mW, respectively.","PeriodicalId":127156,"journal":{"name":"2018 International SoC Design Conference (ISOCC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"12-bit 20M-S/s SAR ADC using C-R DAC and Capacitor Calibration\",\"authors\":\"Eunji Youn, Young-Chan Jang\",\"doi\":\"10.1109/ISOCC.2018.8649894\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A successive approximation register (SAR) analog-to-digital converter (ADC) using a capacitor-resistor(C-R) digital-to-analog-converter (DAC) is proposed to implement the resolution of 12 bits maintaining the area for 10 bits. A calibration for upper-bit capacitors of the C-R DAC is proposed to increase the performance of the static and dynamic performances. To evaluate the proposed ADC, a 12-bit 20M-S/s SAR ADC is implemented using a 110-nm CMOS process with a supply of 1.2 V. The area and power consumption of the proposed ADC are 0.204 mm2 and 1.24 mW, respectively.\",\"PeriodicalId\":127156,\"journal\":{\"name\":\"2018 International SoC Design Conference (ISOCC)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International SoC Design Conference (ISOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISOCC.2018.8649894\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC.2018.8649894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
摘要
提出了一种采用电容-电阻(C-R)数模转换器(DAC)的逐次逼近寄存器(SAR)模数转换器(ADC),实现了12位的分辨率,保持了10位的面积。为了提高C-R DAC的静态和动态性能,提出了对其上位电容进行标定的方法。为了评估所提出的ADC,采用110纳米CMOS工艺实现了一个12位20M-S/s SAR ADC,电源为1.2 V。该ADC的面积和功耗分别为0.204 mm2和1.24 mW。
12-bit 20M-S/s SAR ADC using C-R DAC and Capacitor Calibration
A successive approximation register (SAR) analog-to-digital converter (ADC) using a capacitor-resistor(C-R) digital-to-analog-converter (DAC) is proposed to implement the resolution of 12 bits maintaining the area for 10 bits. A calibration for upper-bit capacitors of the C-R DAC is proposed to increase the performance of the static and dynamic performances. To evaluate the proposed ADC, a 12-bit 20M-S/s SAR ADC is implemented using a 110-nm CMOS process with a supply of 1.2 V. The area and power consumption of the proposed ADC are 0.204 mm2 and 1.24 mW, respectively.