多路跟踪信号选择使用非平凡的隐含相关

S. Prabhakar, M. Hsiao
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引用次数: 21

摘要

带有跟踪缓冲区的硅调试为调试中的设计提供了实时可见性。它在正常工作期间跟踪内部信号的一小部分。因此,硅调试的有效性主要取决于跟踪信号的选择。本文提出了一种新的基于多路复用器的跟踪信号互连方案和一种新的基于隐含相关的跟踪信号选择启发式算法。因此,在相同的跟踪缓冲区宽度下,我们可以有效地跟踪两倍的信号。我们还提出了一种基于sat的启发式方法来进一步修剪所选的跟踪信号列表,以考虑那些多节点影响。最后,我们提出了一种基于多路复用器的跟踪信号互连方案的状态恢复算法。序列基准电路的实验表明,该方法能有效地选择跟踪信号,与其他方法相比具有更高的恢复率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Multiplexed trace signal selection using non-trivial implication-based correlation
Silicon debug with a trace buffer provides real-time visibility to the design under debug. It traces a small subset of internal signals during its normal operation. The effectiveness of silicon debug, then, depends critically on the selection of trace signals. This paper proposes a new multiplexer-based trace signal interconnection scheme and a new heuristic for trace signal selection based on implication-based correlation. As a result, we can effectively trace twice as many signals with the same trace buffer width. We also propose a SAT-based heuristic to prune the selected trace signal list further to take into account those multi-node implications. Finally, we propose a state restoration algorithm for the multiplexer-based trace signal interconnection scheme. Experiments for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving superior restoration percentage compared with other techniques.
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