B. Peng, Ling Wu, Hao-wen Luo, Wenqing Xu, E. Horacio
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Investigation of the piezoelectric properties of semiconducting nanostructures
In this paper, the piezoelectric properties of semiconducting nano structures have been investigated. The piezoelectric effect can be characterized via a nano-scale material testing system that utilizing microelectromechanical systems technology. The coefficients were measured by applying a voltage (field) and measuring the induced elongation (strain). It can be readily seen that the piezoelectric effects in nanostructures are generally non-linear and the coefficient is much higher than that for bulk.
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