飞思卡尔P2020和P5020处理器的SEE测试结果

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004587

S. Guertin, Mehran Amrbar

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引用次数: 5

摘要

飞思卡尔处理器进行重离子和质子SEE测试。P2020测试了缓存和寄存器位扰动以及各种算法的扰动和内存控制器扰动。P5020测试了缓存和寄存器位扰动以及内存控制器扰动。测试各种算法的有效性仅限于P2020的质子测试，并且由于寄存器和缓存中断，通常在保真度上受到限制。

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SEE Test Results for P2020 and P5020 Freescale Processors

Freescale processors are tested for heavy ion and proton SEE. The P2020 is tested for cache and register bit upsets as well as for upsets of various algorithms and memory controller upsets. The P5020 is tested for cache and register bit upsets as well as memory controller upsets. Effectiveness of testing various algorithms is limited to proton testing of the P2020 and is generally limited in fidelity due to register and cache upsets.

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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