采用较薄硅衬底的高光电流和高工作频率的光寻址电位传感器

Tsung-Cheng Chen, Wei-Yin Zeng, Y. Liao, Anirban Das, Chia‐Ming Yang, Chao‐Sung Lai
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引用次数: 0

摘要

首先研究了不同厚度p型硅片的LAPS的光电流、外加交流信号的工作频率和pH传感性能。采用反应性射频溅射法制备高介电常数材料氧化铌(NbOx)作为传感膜。pH敏感性约为60.3 mV/pH,线性度为99.1%。薄硅衬底具有较高的光电压,特别是对高频交流信号。在交流信号为20kHz时,350 um Si的光电压显示与500 um Si相当。即使在频率高于50 kHz的情况下,化学图像传感器用模拟反射镜和红色激光也能实现快速扫描。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High photocurrent and operation frequency for light-addressable potentiometric sensor by thinner Si substrate
LAPS with different thickness of P-type silicon wafers are first investigated for photocurrent, operation frequency of applied ac signal and pH sensing performance, respectively. A high dielectric constant material, niobium oxide (NbOx), was directly deposited as the sensing membrane by reactive radio frequency sputtering. pH sensitivity is around 60.3 mV/pH with linearity of 99.1%. Thin Si substrate has higher photovoltage, especially with high-frequency ac signal. With ac signal of 20kHz, photovoltage of 350 um Si shows comparable to 500 um Si. Even in frequency higher than 50 kHz, fast scanning speed could be achieved by analog mirror and red laser for chemical image sensor.
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