{"title":"测试信息管理不善的问题","authors":"J. Heiser, G.L. Hinkle","doi":"10.1109/AUTEST.1994.381605","DOIUrl":null,"url":null,"abstract":"Electronics testing is accomplished to identify components that have prevented an electronic assembly from performing as designed. This paper identifies the information related obstacles traditionally encountered in this process and points to the ABBET component standards that have been and are being introduced to enable new paradigms to dramatically improve the test information process.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The problem of mismanagement of test information\",\"authors\":\"J. Heiser, G.L. Hinkle\",\"doi\":\"10.1109/AUTEST.1994.381605\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electronics testing is accomplished to identify components that have prevented an electronic assembly from performing as designed. This paper identifies the information related obstacles traditionally encountered in this process and points to the ABBET component standards that have been and are being introduced to enable new paradigms to dramatically improve the test information process.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381605\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electronics testing is accomplished to identify components that have prevented an electronic assembly from performing as designed. This paper identifies the information related obstacles traditionally encountered in this process and points to the ABBET component standards that have been and are being introduced to enable new paradigms to dramatically improve the test information process.<>
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