一种灵活容错FU阵列处理器及其定位永久故障单元的自调谐方案

Jun Yao, Y. Nakashima, Mitsutoshi Saito, Yohei Hazama, Ryosuke Yamanaka
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引用次数: 1

摘要

在这项工作中,我们提出了显式冗余线性阵列(EReLA)架构,以提供高度灵活的容错,有效地利用其在功能单元阵列(FU)中的丰富资源进行错误检测和故障安全热插拔。对于热插拔的制备,提出了一种自调谐方案,以快速定位永久缺陷单元的精确位置,永久缺陷单元可以是计算单元、LD/ST单元,也可以是连接网络。因此,EReLA可以以最小的粒度隔离永久缺陷单元,从而允许更多的热交换并相应地延长整个处理器的使用寿命。考虑到这些方案,EReLA在容错方面与传统的TMR处理器功能相同,而180nm原型EReLA芯片的功耗数据表明,其功耗远低于TMR实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A flexibly fault-tolerant FU array processor and its self-tuning scheme to locate permanently defective unit
In this work, we propose the Explicit Redundancy Linear Array (EReLA) architecture to provide a highly flexible fault-toleration, which effectively utilizes its rich resources in a functional unit (FU) array for both the error detection and the fail-safe hot-swap after taking a permanent fault. For the preparation of the hot-swap, a self-tuning scheme is proposed specifically to fast locate the precise position of the permanently defective units, which can be either the computational, LD/ST FUs, or the connecting network as well. EReLA can thereby isolates the permanently defective unit at the smallest granularity, which allows more hot-swaps and extends accordingly the lifespan of the whole processor. Given these schemes, EReLA is functionally same to a traditional TMR processor in terms of fault toleration, while the power data of a 180nm prototype EReLA chip has indicated that it incurs far less power consumption than the TMR implementation.
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