Jun Yao, Y. Nakashima, Mitsutoshi Saito, Yohei Hazama, Ryosuke Yamanaka
{"title":"一种灵活容错FU阵列处理器及其定位永久故障单元的自调谐方案","authors":"Jun Yao, Y. Nakashima, Mitsutoshi Saito, Yohei Hazama, Ryosuke Yamanaka","doi":"10.1109/CoolChips.2014.6842951","DOIUrl":null,"url":null,"abstract":"In this work, we propose the Explicit Redundancy Linear Array (EReLA) architecture to provide a highly flexible fault-toleration, which effectively utilizes its rich resources in a functional unit (FU) array for both the error detection and the fail-safe hot-swap after taking a permanent fault. For the preparation of the hot-swap, a self-tuning scheme is proposed specifically to fast locate the precise position of the permanently defective units, which can be either the computational, LD/ST FUs, or the connecting network as well. EReLA can thereby isolates the permanently defective unit at the smallest granularity, which allows more hot-swaps and extends accordingly the lifespan of the whole processor. Given these schemes, EReLA is functionally same to a traditional TMR processor in terms of fault toleration, while the power data of a 180nm prototype EReLA chip has indicated that it incurs far less power consumption than the TMR implementation.","PeriodicalId":366328,"journal":{"name":"2014 IEEE COOL Chips XVII","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A flexibly fault-tolerant FU array processor and its self-tuning scheme to locate permanently defective unit\",\"authors\":\"Jun Yao, Y. Nakashima, Mitsutoshi Saito, Yohei Hazama, Ryosuke Yamanaka\",\"doi\":\"10.1109/CoolChips.2014.6842951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we propose the Explicit Redundancy Linear Array (EReLA) architecture to provide a highly flexible fault-toleration, which effectively utilizes its rich resources in a functional unit (FU) array for both the error detection and the fail-safe hot-swap after taking a permanent fault. For the preparation of the hot-swap, a self-tuning scheme is proposed specifically to fast locate the precise position of the permanently defective units, which can be either the computational, LD/ST FUs, or the connecting network as well. EReLA can thereby isolates the permanently defective unit at the smallest granularity, which allows more hot-swaps and extends accordingly the lifespan of the whole processor. Given these schemes, EReLA is functionally same to a traditional TMR processor in terms of fault toleration, while the power data of a 180nm prototype EReLA chip has indicated that it incurs far less power consumption than the TMR implementation.\",\"PeriodicalId\":366328,\"journal\":{\"name\":\"2014 IEEE COOL Chips XVII\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE COOL Chips XVII\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CoolChips.2014.6842951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE COOL Chips XVII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CoolChips.2014.6842951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A flexibly fault-tolerant FU array processor and its self-tuning scheme to locate permanently defective unit
In this work, we propose the Explicit Redundancy Linear Array (EReLA) architecture to provide a highly flexible fault-toleration, which effectively utilizes its rich resources in a functional unit (FU) array for both the error detection and the fail-safe hot-swap after taking a permanent fault. For the preparation of the hot-swap, a self-tuning scheme is proposed specifically to fast locate the precise position of the permanently defective units, which can be either the computational, LD/ST FUs, or the connecting network as well. EReLA can thereby isolates the permanently defective unit at the smallest granularity, which allows more hot-swaps and extends accordingly the lifespan of the whole processor. Given these schemes, EReLA is functionally same to a traditional TMR processor in terms of fault toleration, while the power data of a 180nm prototype EReLA chip has indicated that it incurs far less power consumption than the TMR implementation.