热带湿热对晶体硅光伏组件分流、串联电阻和填充系数的影响

Minadohona Maxime Capo-Chichi, V. I. Madogni, C. Kouchadé, G. Hounkpatin, M. Agbomahena, B. Kounouhewa
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引用次数: 1

摘要

大多数太阳能组件制造商保证其组件的最低性能为20至25年。但在安装一段时间后,人们观察到这些模块的各个组件出现故障。在长期暴露于恶劣的气候条件下,这些故障随着时间的推移而积累,导致模块的性能损失。这种性能下降是由于几个因素,如湿度,温度,热量,辐照等。这些因素引起各种降解过程,可以是电的,化学的,机械的,热的等。热带地区是我们研究的中心,具有高热量和高湿度的特点,对光伏组件的电气参数有一定的影响。电学参数的退化是造成光伏组件性能损失的原因之一。本研究的目的是研究安装在热带地区的光伏组件的并联电阻、串联电阻和外形系数的退化,以了解它们对后者性能损失的影响。为此,我们采用Peck性能退化分析模型和Braisaz并联电阻和串联电阻的退化分析模型,计算了在四十多年的时间里,在热带环境的实际条件下,光伏组件这些电学参数的退化情况。所获得的结果与2009年在佛罗里达州迈阿密州进行的Hulkoff实验测试的结果进行了比较。6个城市电阻分路的退化率在17.33 ~ 35.67%之间,串联电阻在3.77 ~ 7.55%之间,填充系数在8 ~ 19%之间。此外,Hulkoff实验得到的并被[1]采用的这些电参数退化率,在研究期间,并联电阻的退化率为35.14%,串联电阻的退化率为9.43%,填充因子的退化率为3.03%。因此,湿热对热带地区短路电流和开路电压的影响是晶体硅光伏太阳能组件未来的研究方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effects of Damp-heat on Shunt, Series Resistances and Fill Factor into Crystalline Silicon Photovoltaic Solar Modules in Tropical Zone
Most solar module manufacturers guarantee the minimum performance of their modules for 20 to 25 years. But some time after their installation, one observes faults which appear on the various components of these modules. During long-term exposure to severe climatic conditions, these faults, which accumulate over time, lead to performance losses of the module. This performance degradation is due to several factors such as humidity, temperature, heat, irradiation etc. These factors cause various degradation processes which can be electrical, chemical, mechanical, thermal, etc. The tropical zone, the middle of our study being characterized by high heat and humidity, has definite impacts on the electrical parameters of photovoltaic modules. The electrical parameters degradation is among others cause of photovoltaic modules performance loss. This study purpose is to study the degradation of the shunt resistance, the series resistance and the form factor of photovoltaic modules installed in tropical areas in order to appreciate their impact on the performance loss of the latter. For that, we used Peck performance degradation analytical model and Braisaz degradation analytical models of shunt resistance and the series resistance to calculate over a period of forty years, in real conditions in the tropical environment, the degradation of these electrical parameters of the photovoltaic module. The results obtained are compared to those obtained during the Hulkoff experimental tests in the state of Miami in Florida in 2009. The degradation rates obtained in the six cities concerned by the study vary between 17.33-35.67% for resistance shunt, between 3.77-7.55% for the series resistance and between 8-19% for the fill factor. In addition, these electrical parameters degradation rates obtained experimentally by Hulkoff and taken up by [1], are respectively 35.14% for the shunt resistor, 9.43% for the series resistor and 3.03% for the fill factor over the study period. So, future researches on crystalline silicon photovoltaic solar module can be effect of Damp-Heat on short circuit current and open circuit voltage in tropical area.
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