{"title":"设计完整性和抗扰性检查:布局验证和设计规则检查的新视角","authors":"Edward J. McGrath, T. Whitney","doi":"10.1145/800139.804537","DOIUrl":null,"url":null,"abstract":"A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.","PeriodicalId":196513,"journal":{"name":"17th Design Automation Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Design Integrity and Immunity Checking: A New Look at Layout Verification and Design Rule Checking\",\"authors\":\"Edward J. McGrath, T. Whitney\",\"doi\":\"10.1145/800139.804537\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.\",\"PeriodicalId\":196513,\"journal\":{\"name\":\"17th Design Automation Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"17th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/800139.804537\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/800139.804537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design Integrity and Immunity Checking: A New Look at Layout Verification and Design Rule Checking
A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.