设计完整性和抗扰性检查:布局验证和设计规则检查的新视角

Edward J. McGrath, T. Whitney
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引用次数: 10

摘要

提出了一种新的版图验证方法。该方法使用拓扑和设备信息来消除大多数虚假和未检查的错误。这种技术,加上分层前端消除冗余检查,适合VLSI设计的布局验证。本文还介绍了适用于该技术的设计规则、结构化设计环境中的一些使用规则,并对设计规则检查的未来进行了讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design Integrity and Immunity Checking: A New Look at Layout Verification and Design Rule Checking
A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.
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