低电阻大电流金属封装热变形与热应力可靠性研究

R. Bai, Songliang Jia, X. Sun, B. Deng, Xide Li, Leang Lin, Z. Zhuang, Yu Yang, Shuidi Wang, Zhonghui Zhang
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引用次数: 0

摘要

采用实验和数值方法对包装结构的热变形和应力进行了研究。采用激光散斑干涉法测试了金属复合引线的热膨胀系数(CTE)和整个封装结构在室温至150/spl℃时的热变形。采用ABAQUS/标准有限元程序对包装结构在室温至150/spl℃范围内的热变形和应力进行了数值模拟。数值模拟结果与实验结果吻合较好。结果表明,所预测的热应力和变形在工作状态下是定性可靠的。此外,在有限元分析中采用元件失活和活化技术,模拟了从779/spl℃冷却到室温的包装结构的制造过程。得到了加工过程中的残余热变形和应力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability research on the thermal deformation and thermal stress of the metal packaging with low resistance and high electric current
Thermal deformations and stresses of packaging structures were investigated by both experimental and numerical methods. Laser speckle interferometry was used as the experimental method to test the coefficient of thermal expansion (CTE) of the metal composite leads and the thermal deformations of the entire packaging structures due to the change of temperature from room-temperature to 150/spl deg/C. ABAQUS/standard finite element (FE) code was used to simulate the thermal deformations and stresses from room-temperature to 150/spl deg/C for the-packaging structures. The results of numerical simulations were in good agreement with those of experiments. It showed that the predicted thermal stresses and deformations in the working condition were qualitatively reliable. Moreover, the technique of element deactivation and activation was used in the FE analysis to simulate the manufacturing process of the packaging structures cooled from 779/spl deg/C to room-temperature. The residual thermal deformations and stresses during the process were obtained.
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