用严格的衍射理论分析表面等离子体显微镜

Suejit Pechprasarn, M. Somekh
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引用次数: 1

摘要

表面等离子体显微镜为生物成像的应用提供了巨大的潜力,特别是在局部区域的折射率定量测量方面。我们的目标是测量折射率的变化,以便在比传统的基于棱镜的SP成像更小的空间尺度上测量诸如抗体-抗原结合之类的重要事件。为此,我们使用了严格的耦合波分析(RCWA)来建立一个理论框架,以了解SP显微镜测量局部折射率变化的能力。我们的研究结果表明,非干涉显微镜结构给出的结果强烈依赖于SPs的传播长度,而在干涉模式下,SPs的测量路径由样品离焦决定,并且沿着不同路径的SPs不会被检测到。这样可以更好地定位局部折射率的测量,以及更可预测的值,因为它取决于光学装置而不是样品性质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysing surface plasmon microscopy with rigorous diffraction theory
Surface plasmon (SP) microscopy offers great potential for bioimaging applications particularly for quantitative measurement of refractive index over localized regions. Our aim is to measure variations in refractive index so that important events such as antibody-antigen binding can be measured on smaller spatial scales than is possible with conventional prism based SP imaging. To this end we have used rigorous coupled wave analysis (RCWA) to develop a theoretical framework to understand the capability of the SP microscope to measure local changes in refractive index. Our results show that the non-interferometric microscope configuration gives results which are strongly dependent on the propagation length of the SPs, whereas in the interference mode the measured path of the SPs is determined by the sample defocus and SPs following different paths are not detected. This gives better localization of the measurement of local refractive index as well as a more predictable value as it depends on the optical set rather than sample properties.
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