{"title":"Ni/Sn/Cu焊点的相互作用效应","authors":"H. Tseng, S. Wang, C. Y. Liu","doi":"10.1109/EPTC.2009.5416529","DOIUrl":null,"url":null,"abstract":"The mutual interaction between Sn/Ni and Sn/Cu interfacial reactions in a Ni/Sn/Cu sandwich solder joint structure has been discussed in this present work. The major interfacial reaction product on the Sn/Cu interface was Cu6Sn5 phase, while on the Sn/Ni interface, a ternary (Cu,Ni)6Sn5 compound layer was formed, instead of the typical Ni-Sn compound phase. On the other hand, an asymmetrical solder microstructure was observed in the Ni/Sn/Cu solder joint. The asymmetrical solder microstructure resulted from the Cu concentration gradient along the Ni/Sn/Cu solder joint. Mechanical tensile tests showed that the mechanical property of the Ni/Sn/Cu solder joint is highly correlated with the asymmetrical solder microstructure.","PeriodicalId":256843,"journal":{"name":"2009 11th Electronics Packaging Technology Conference","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Cross-interaction effect in the Ni/Sn/Cu solder joints\",\"authors\":\"H. Tseng, S. Wang, C. Y. Liu\",\"doi\":\"10.1109/EPTC.2009.5416529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The mutual interaction between Sn/Ni and Sn/Cu interfacial reactions in a Ni/Sn/Cu sandwich solder joint structure has been discussed in this present work. The major interfacial reaction product on the Sn/Cu interface was Cu6Sn5 phase, while on the Sn/Ni interface, a ternary (Cu,Ni)6Sn5 compound layer was formed, instead of the typical Ni-Sn compound phase. On the other hand, an asymmetrical solder microstructure was observed in the Ni/Sn/Cu solder joint. The asymmetrical solder microstructure resulted from the Cu concentration gradient along the Ni/Sn/Cu solder joint. Mechanical tensile tests showed that the mechanical property of the Ni/Sn/Cu solder joint is highly correlated with the asymmetrical solder microstructure.\",\"PeriodicalId\":256843,\"journal\":{\"name\":\"2009 11th Electronics Packaging Technology Conference\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 11th Electronics Packaging Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2009.5416529\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 11th Electronics Packaging Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2009.5416529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cross-interaction effect in the Ni/Sn/Cu solder joints
The mutual interaction between Sn/Ni and Sn/Cu interfacial reactions in a Ni/Sn/Cu sandwich solder joint structure has been discussed in this present work. The major interfacial reaction product on the Sn/Cu interface was Cu6Sn5 phase, while on the Sn/Ni interface, a ternary (Cu,Ni)6Sn5 compound layer was formed, instead of the typical Ni-Sn compound phase. On the other hand, an asymmetrical solder microstructure was observed in the Ni/Sn/Cu solder joint. The asymmetrical solder microstructure resulted from the Cu concentration gradient along the Ni/Sn/Cu solder joint. Mechanical tensile tests showed that the mechanical property of the Ni/Sn/Cu solder joint is highly correlated with the asymmetrical solder microstructure.
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