{"title":"应变介导InGaAs量子点的结构和光学特性","authors":"C.Y. Chen, D. Feng, T. Tzeng, T. Lay, T. Chang","doi":"10.1109/ICIPRM.2007.381153","DOIUrl":null,"url":null,"abstract":"Self-assembled In<sub>x</sub>Ga<sub>1-x</sub>As quantum dots, with In(Ga)As capping layers to mediate the strain distribution were studied by x-ray reciprocal space mapping, TEM, and PL. The In<sub>0.75</sub>Ga<sub>0.25</sub>As QDs capped with In<sub>0.1</sub>Ga<sub>0.9</sub>As has a PL emission at lambda = 1.31 mum.","PeriodicalId":352388,"journal":{"name":"2007 IEEE 19th International Conference on Indium Phosphide & Related Materials","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural and Optical Characteristics of Strain-mediated InGaAs Quantum Dots\",\"authors\":\"C.Y. Chen, D. Feng, T. Tzeng, T. Lay, T. Chang\",\"doi\":\"10.1109/ICIPRM.2007.381153\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Self-assembled In<sub>x</sub>Ga<sub>1-x</sub>As quantum dots, with In(Ga)As capping layers to mediate the strain distribution were studied by x-ray reciprocal space mapping, TEM, and PL. The In<sub>0.75</sub>Ga<sub>0.25</sub>As QDs capped with In<sub>0.1</sub>Ga<sub>0.9</sub>As has a PL emission at lambda = 1.31 mum.\",\"PeriodicalId\":352388,\"journal\":{\"name\":\"2007 IEEE 19th International Conference on Indium Phosphide & Related Materials\",\"volume\":\"126 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE 19th International Conference on Indium Phosphide & Related Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIPRM.2007.381153\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE 19th International Conference on Indium Phosphide & Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.2007.381153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structural and Optical Characteristics of Strain-mediated InGaAs Quantum Dots
Self-assembled InxGa1-xAs quantum dots, with In(Ga)As capping layers to mediate the strain distribution were studied by x-ray reciprocal space mapping, TEM, and PL. The In0.75Ga0.25As QDs capped with In0.1Ga0.9As has a PL emission at lambda = 1.31 mum.