{"title":"模拟和混合信号器件的线性误差建模","authors":"G. Stenbakken, T., Michael Souders","doi":"10.1109/TEST.1991.519720","DOIUrl":null,"url":null,"abstract":"Techniquesare presented for developinglinear error models for analog and mixed-signal devices. Methods for choosingparameters and assuring the models are complete and wellconditioned, are included. Once established, the models can be used in a comprehensive approach for optimizing the testing of the subject devices.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"LINEAR ERROR MODELING OF ANALOG AND MIXED-SIGNAL DEVICES\",\"authors\":\"G. Stenbakken, T., Michael Souders\",\"doi\":\"10.1109/TEST.1991.519720\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Techniquesare presented for developinglinear error models for analog and mixed-signal devices. Methods for choosingparameters and assuring the models are complete and wellconditioned, are included. Once established, the models can be used in a comprehensive approach for optimizing the testing of the subject devices.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519720\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LINEAR ERROR MODELING OF ANALOG AND MIXED-SIGNAL DEVICES
Techniquesare presented for developinglinear error models for analog and mixed-signal devices. Methods for choosingparameters and assuring the models are complete and wellconditioned, are included. Once established, the models can be used in a comprehensive approach for optimizing the testing of the subject devices.
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