{"title":"基于内部状态最大利用率的顺序电路测试生成方法","authors":"Toshinobu Ono, Masaaki Yoshida","doi":"10.1109/TEST.1991.519496","DOIUrl":null,"url":null,"abstract":"This paper presents a novel deterministic test pattern generation method for sequential circuits. The proposed method has several advantages over conventional methods, particularly in its maximum utilization of internal states. Such utilization permits shorter computational time, reduced test pattern length and fewer timing problems. In this method, the type of fault targeted for the next pattern generation is that which, on the basis of the current internal state of the circuit, is determined to be the easiest type to detect, and during pattern generation, the only value transitions traced are those which are necessary for a particular fault's detection. Experimental results show the proposed method to be efficient.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A test generation method for sequential circuits based on maximum utilization of internal states\",\"authors\":\"Toshinobu Ono, Masaaki Yoshida\",\"doi\":\"10.1109/TEST.1991.519496\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel deterministic test pattern generation method for sequential circuits. The proposed method has several advantages over conventional methods, particularly in its maximum utilization of internal states. Such utilization permits shorter computational time, reduced test pattern length and fewer timing problems. In this method, the type of fault targeted for the next pattern generation is that which, on the basis of the current internal state of the circuit, is determined to be the easiest type to detect, and during pattern generation, the only value transitions traced are those which are necessary for a particular fault's detection. Experimental results show the proposed method to be efficient.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519496\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519496","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A test generation method for sequential circuits based on maximum utilization of internal states
This paper presents a novel deterministic test pattern generation method for sequential circuits. The proposed method has several advantages over conventional methods, particularly in its maximum utilization of internal states. Such utilization permits shorter computational time, reduced test pattern length and fewer timing problems. In this method, the type of fault targeted for the next pattern generation is that which, on the basis of the current internal state of the circuit, is determined to be the easiest type to detect, and during pattern generation, the only value transitions traced are those which are necessary for a particular fault's detection. Experimental results show the proposed method to be efficient.