为片上系统设计集成单一物理验证工具

{"title":"为片上系统设计集成单一物理验证工具","authors":"J. Paris","doi":"10.1109/IWSOC.2004.10002","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":306688,"journal":{"name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integrating a single physical verification tool for systems-on-chip designs\",\"authors\":\"J. Paris\",\"doi\":\"10.1109/IWSOC.2004.10002\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":306688,\"journal\":{\"name\":\"4th IEEE International Workshop on System-on-Chip for Real-Time Applications\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"4th IEEE International Workshop on System-on-Chip for Real-Time Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWSOC.2004.10002\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWSOC.2004.10002","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}