用于高分辨率成像x射线光谱仪的弯曲晶体性能测量

M. Haugh, R. Stewart
{"title":"用于高分辨率成像x射线光谱仪的弯曲晶体性能测量","authors":"M. Haugh, R. Stewart","doi":"10.1155/2010/583626","DOIUrl":null,"url":null,"abstract":"This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ Δ E > 2000 . A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer\",\"authors\":\"M. Haugh, R. Stewart\",\"doi\":\"10.1155/2010/583626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ Δ E > 2000 . A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.\",\"PeriodicalId\":193128,\"journal\":{\"name\":\"X-ray Optics and Instrumentation\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"X-ray Optics and Instrumentation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1155/2010/583626\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"X-ray Optics and Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/2010/583626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

本文介绍了用于测量惯性约束等离子体中离子多普勒加宽的13kev垂直约翰光谱仪的设计、晶体选择和晶体测试。该光谱仪采用薄而弯曲的云母晶体,分辨率达到E/ Δ E > 2000。筛选了一些天然云母晶体的平整度和x射线衍射宽度,以找到足够完美的样品用于仪器。讨论了选择和安装高质量云母样品的程序。采用双测角仪耦合的二极管型x射线源测量了晶体反射率曲线。利用一组衍射级硅晶体,开发了一种评估测角仪性能的方法。该测角仪系统为进一步鉴定最佳原始晶体和发展为光谱仪选择满意的弯曲晶体的技术提供了宝贵的价值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer
This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ Δ E > 2000 . A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.
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