识别锁定风险的EDA方法

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2016-09-01 DOI:10.1109/EOSESD.2016.7592552

M. Khazhinsky, K. Domanski, Guido Quax, Scott Ruth, F. Farbiz, N. Trivedi, H. Gossner

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引用次数: 5

摘要

本文综述了闭锁保护的验证方法和EDA面临的挑战。我们演示了需要高级连接性分析的复杂静态和瞬态闭锁场景。利用各种EDA验证流程和工具，我们研究了与接地n井、偏置n井和在ESD事件中形成的寄生晶闸管相关的锁存问题。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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EDA approaches in identifying latchup risks

In this paper we review latchup protection verification methods and EDA challenges. We demonstrate complex static and transient latchup scenarios requiring advanced connectivity analysis. Using various EDA verification flows and tools we study latchup problems associated with grounded n-wells, biased n-wells and parasitic thyristors formed during ESD events.

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来源期刊

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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