客户观点和需求面板

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1271138

D. L. Wheater

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引用次数: 1

摘要

做“最小”DFT只是为了避免购买“下一个”测试仪，还是做所有的“片上”测试，并将ATE降低到电池、数据源和接收器的成本，或者硅是如此珍贵，以至于任何与任务无关的功能的使用都会使最终芯片的成本令人难以承受。人们可以很容易地找到每个立场的支持者和支持它的数据。这是因为答案高度依赖于设备设计的细节以及与设备将要进入的商业案例相关的问题。

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Ate-customer perspectives & requirements panel

Does one do the “minimum” DFT just to avoid buying the “next” tester, does one do all the test “on chip” and cost reduce the ATE down to a battery and a data source and sink, or is silicon so precious that any use for non mission related function make the cost of the final die prohibitive. One can easily find proponents for each position and the data to back it up. This is because the answer is highly dependent on the particulars of the design of the device and the issues related to the business case that the device is going into.

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来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

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