在GaAs线结构上选择性形成InAs单量子点和多量子点用于单电子存储器

J. Motohisa, T. Terasawa, T. Kusuhara, F. Nakajima, T. Fukui
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引用次数: 0

摘要

我们描述了在蒙面[001]GaAs衬底上结合选择性区域金属有机气相外延(SA-MOVPE)形成自组装的InAs量子点(QDs)。发现SA-MOVPE中量子点的形成与GaAs台面和线结构的方向和顶宽有关。特别是,主要形成于[001]顶表面边缘的表面台阶影响了量子点的形成。利用这种阶跃诱导的孤岛在导线的两个方向的弯曲处形成位置控制的单InAs量子点。我们还讨论了量子点在单电子存储器中的可能应用,其中位置控制量子点与由SA-MOVPE技术实现的脊量子线结合使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Selective formation of InAs single and multiple quantum dots on GaAs wire structures for application of single electron memory
We describe formation of self-assembling InAs quantum dots (QDs) combined with selective area metalorganic vapor phase epitaxy (SA-MOVPE) on masked [001] GaAs substrates. It was found that formation of QDs in SA-MOVPE depended on the direction and top width of the GaAs mesa and wire structures. In particular, surface steps, which are mainly formed at the edge of the [001] top surface, affect the formation of QDs. Such step-induced islanding is utilized to form a position controlled single InAs QD at the bend of the wires in two directions. We also discuss a possible application of QDs for single electron memories where position-controlled QDs are used in combination with ridge quantum wires realized by the SA-MOVPE technology.
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