{"title":"用于扫描测试的记忆复用触发器","authors":"Chuandong Chen, Wei Hu","doi":"10.1109/ICCPS.2016.7751109","DOIUrl":null,"url":null,"abstract":"Based on the model of memeristor fabricated at HP laboratory, a new multiplexed flip-flop is proposed which can support power-off mode for scan testing. Testing data can be stored in memristor during the power-off time. The analyzes are verified with SPICE simulation, signal waveforms show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing.","PeriodicalId":348961,"journal":{"name":"2016 International Conference On Communication Problem-Solving (ICCP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Memristive multiplexed flip-flop for scan testing\",\"authors\":\"Chuandong Chen, Wei Hu\",\"doi\":\"10.1109/ICCPS.2016.7751109\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on the model of memeristor fabricated at HP laboratory, a new multiplexed flip-flop is proposed which can support power-off mode for scan testing. Testing data can be stored in memristor during the power-off time. The analyzes are verified with SPICE simulation, signal waveforms show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing.\",\"PeriodicalId\":348961,\"journal\":{\"name\":\"2016 International Conference On Communication Problem-Solving (ICCP)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference On Communication Problem-Solving (ICCP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCPS.2016.7751109\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference On Communication Problem-Solving (ICCP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCPS.2016.7751109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Based on the model of memeristor fabricated at HP laboratory, a new multiplexed flip-flop is proposed which can support power-off mode for scan testing. Testing data can be stored in memristor during the power-off time. The analyzes are verified with SPICE simulation, signal waveforms show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing.
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