Christos A. Papachristou, S. Chiu, Haidar Harmanani
{"title":"SYNTEST:一种具有自测试性的高级合成方法","authors":"Christos A. Papachristou, S. Chiu, Haidar Harmanani","doi":"10.1109/ICCD.1991.139947","DOIUrl":null,"url":null,"abstract":"The article introduces a new high-level synthesis method for self-testable RTL designs. A basic feature of this method is a structural testability model which treats testability as a structural design style integrated in the design process. The main objective is to develop a system-level synthesis tool set mapping a behavioral description onto an optimized and testable RTL design subject to user-defined constraints. The approach involves several major components within the following system-level iteration: scheduling and allocation, constraint estimation, and testability tradeoffs.<<ETX>>","PeriodicalId":239827,"journal":{"name":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","volume":"254 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"SYNTEST: a method for high-level SYNthesis with self-TESTability\",\"authors\":\"Christos A. Papachristou, S. Chiu, Haidar Harmanani\",\"doi\":\"10.1109/ICCD.1991.139947\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article introduces a new high-level synthesis method for self-testable RTL designs. A basic feature of this method is a structural testability model which treats testability as a structural design style integrated in the design process. The main objective is to develop a system-level synthesis tool set mapping a behavioral description onto an optimized and testable RTL design subject to user-defined constraints. The approach involves several major components within the following system-level iteration: scheduling and allocation, constraint estimation, and testability tradeoffs.<<ETX>>\",\"PeriodicalId\":239827,\"journal\":{\"name\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"volume\":\"254 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.1991.139947\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1991.139947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SYNTEST: a method for high-level SYNthesis with self-TESTability
The article introduces a new high-level synthesis method for self-testable RTL designs. A basic feature of this method is a structural testability model which treats testability as a structural design style integrated in the design process. The main objective is to develop a system-level synthesis tool set mapping a behavioral description onto an optimized and testable RTL design subject to user-defined constraints. The approach involves several major components within the following system-level iteration: scheduling and allocation, constraint estimation, and testability tradeoffs.<>