基于ldpc的特征约简和机器学习的IJTAG攻击检测

Xuanle Ren, Shawn Blanton, V. Tavares
{"title":"基于ldpc的特征约简和机器学习的IJTAG攻击检测","authors":"Xuanle Ren, Shawn Blanton, V. Tavares","doi":"10.1109/ETS.2018.8400684","DOIUrl":null,"url":null,"abstract":"IEEE 1687 standard (IJTAG), as an extension to the IEEE 1149.1, facilitates efficient access to embedded instruments by supporting reconfigurable scan networks. Specifically, IJTAG allows each IP to be wrapped by a test data register (TDR) whose access is controlled by a segment insertion bit (SIB) or a scan-mux control bit (SCB). Because the TDRs and the SIB/SCB network are typically not public, but critical for accessing embedded instruments, they might be used for illegitimate purposes, such as dumping credential data and reverse engineering IP design. Machine learning has been proposed to detect such attacks, but the large number of instruments and parallel execution enabled by the IJTAG produce high-dimensional data, which poses a challenge to on-chip detection. In this paper, we propose to reduce the high-dimensional but sparse data using a low-density parity-check (LDPC) matrix. Experiments using a modified version of the OpenSPARC T2 to include IJTAG functionality demonstrate that the use of feature reduction eliminates 91% of the features, leading to 43% reduction in circuit size without affecting detection accuracy. Also, the on-chip detector adds moderate overhead (∼ 8%) to the IJTAG.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Detection of IJTAG attacks using LDPC-based feature reduction and machine learning\",\"authors\":\"Xuanle Ren, Shawn Blanton, V. Tavares\",\"doi\":\"10.1109/ETS.2018.8400684\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"IEEE 1687 standard (IJTAG), as an extension to the IEEE 1149.1, facilitates efficient access to embedded instruments by supporting reconfigurable scan networks. Specifically, IJTAG allows each IP to be wrapped by a test data register (TDR) whose access is controlled by a segment insertion bit (SIB) or a scan-mux control bit (SCB). Because the TDRs and the SIB/SCB network are typically not public, but critical for accessing embedded instruments, they might be used for illegitimate purposes, such as dumping credential data and reverse engineering IP design. Machine learning has been proposed to detect such attacks, but the large number of instruments and parallel execution enabled by the IJTAG produce high-dimensional data, which poses a challenge to on-chip detection. In this paper, we propose to reduce the high-dimensional but sparse data using a low-density parity-check (LDPC) matrix. Experiments using a modified version of the OpenSPARC T2 to include IJTAG functionality demonstrate that the use of feature reduction eliminates 91% of the features, leading to 43% reduction in circuit size without affecting detection accuracy. Also, the on-chip detector adds moderate overhead (∼ 8%) to the IJTAG.\",\"PeriodicalId\":223459,\"journal\":{\"name\":\"2018 IEEE 23rd European Test Symposium (ETS)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 23rd European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2018.8400684\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 23rd European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2018.8400684","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

IEEE 1687标准(IJTAG)作为IEEE 1149.1的扩展,通过支持可重构扫描网络,促进了对嵌入式仪器的有效访问。具体来说,IJTAG允许每个IP被一个测试数据寄存器(TDR)封装,TDR的访问由一个段插入位(SIB)或一个扫描多路控制位(SCB)控制。由于tdr和SIB/SCB网络通常不是公共的,但对于访问嵌入式仪器至关重要,因此它们可能被用于非法目的,例如转储凭证数据和反向工程IP设计。机器学习已被提出用于检测此类攻击,但IJTAG支持的大量仪器和并行执行产生高维数据,这对片上检测提出了挑战。在本文中,我们提出使用低密度奇偶校验(LDPC)矩阵对高维稀疏数据进行约简。使用包含IJTAG功能的OpenSPARC T2修改版本的实验表明,使用特征缩减消除了91%的特征,在不影响检测精度的情况下减少了43%的电路尺寸。此外,片上检测器为IJTAG增加了适度的开销(约8%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detection of IJTAG attacks using LDPC-based feature reduction and machine learning
IEEE 1687 standard (IJTAG), as an extension to the IEEE 1149.1, facilitates efficient access to embedded instruments by supporting reconfigurable scan networks. Specifically, IJTAG allows each IP to be wrapped by a test data register (TDR) whose access is controlled by a segment insertion bit (SIB) or a scan-mux control bit (SCB). Because the TDRs and the SIB/SCB network are typically not public, but critical for accessing embedded instruments, they might be used for illegitimate purposes, such as dumping credential data and reverse engineering IP design. Machine learning has been proposed to detect such attacks, but the large number of instruments and parallel execution enabled by the IJTAG produce high-dimensional data, which poses a challenge to on-chip detection. In this paper, we propose to reduce the high-dimensional but sparse data using a low-density parity-check (LDPC) matrix. Experiments using a modified version of the OpenSPARC T2 to include IJTAG functionality demonstrate that the use of feature reduction eliminates 91% of the features, leading to 43% reduction in circuit size without affecting detection accuracy. Also, the on-chip detector adds moderate overhead (∼ 8%) to the IJTAG.
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